UMC

28 nm Logic and Mixed-Mode High Performance Compact

28 nm Logic and Mixed-Mode High Performance Compact Process

Technology characteristics

Shrink technology: NO

Core voltage 1.0, 1.1V

I/O voltage 1.8V, 2.5V

MOAT

Twin and triple well

Substrate resistivity 15~25 ohm.cm on Epi- substrate

UHVT, HVT, RVT, LVT, ULVT

Temperature range -40C to 125C

# of metals: 10

Interconnect material: Cu

Dielectric: FSG

Top metal: 8kA, 12kA, 32.5kA

RDL: 14.5kA, 28kA

MoM

MiM: 2fF/µm2

Passivation: single

Wafer size

12 inch

Deliverables

90 samples

Design tools

Cadence CDBA, Laker

Simulation tools

HSPICE, Eldo, Spectre

Verification tools DRC

Cadence, Mentor Graphics, Synopsys

Verification tools LVS

Cadence, Mentor Graphics, Synopsys

Parasitic extraction tools

Cadence, Synopsys, Mentor Graphics

P&R tools

Cadence, Synopsys

Foundry IP

Standard cells

I/O library: NA

Dummy filling

by Foundry

MPW block size

4000µm x 4000µm

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